WebSummary. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. Combined with this molecular specificity, the technique can provide chemical images with a ... Web2 Oct 2024 · In this work, the effect of projectile fragments on the image reconstruction in ion imaging with a prototype detector was presented. By adapting the Δ E − E technique to …
Time-of-Flight Secondary Ion Mass Spectrometry SpringerLink
Webfragmentation of a 290 MeV/u primary carbon ion beam was studied using the Geant4 Monte Carlo Toolkit. When the primary carbon ion beam interacts with water, secondary … Web2 Oct 2024 · This can be considered a general result, since secondary fragments can affect the WEPL evaluation in any particle CT scanner system, independent of the detector … bangkok dfa
Time-of-Flight Secondary Ion Mass Spectrometry - ScienceDirect
Webfragment ion: A term defined in the context of mass spectrometry as the charged product of an ion dissociation. A fragment ion may be stable or dissociate further to form other … Web20 Feb 2024 · The ions emitted from organic samples are analyzed in a mass spectrometer, resulting in positive or negative mass spectra consisting of the precursor or molecular ion peaks and fragment ion peaks characteristic of the surface. Typical secondary ions from organic samples on metallic substrates are Me +/−, [M + H] +, [M − H] −, [M + Sa ... Web1 Jan 2024 · The secondary fragment ion 12 C 14 N − gives a cell signal shown in red (dark grey in print version), and Ag − secondary ion signal is shown in green (light grey in print version). (A and B) Tannic acid (TA) coated Ag NPs and (C and D) polyethylenimine (bPEI) coated Ag NPs of different sizes. pitt eap